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Products > Laboratory Instrument > Spectrometer > FRINGE benchtop XRD analyzer X-ray diffractometer
Product name : FRINGE benchtop XRD analyzer X-ray diffractometer
Product No. : FRINGE
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  Details:
Product Description
FRINGE Benchtop X-ray diffractometer is a desktop X-ray diffractometer, which integrates XRD, XRF, computer software and other technologies. It can quickly conduct qualitative and quantitative analysis, crystal structure analysis, material structure analysis and crystallinity determination for powder, block or thin film and other forms of samples. It has the characteristics of high precision, high accuracy, good stability, wide application range, simple operation and intelligence. For materials research, universities and research institutes, building materials, metals, minerals, plastics, pharmaceuticals, semiconductors and many other fields provide high precision analysis.


Technical Parameters
QGoniometer θ/θ vertical goniometer, diffraction circle radius 150mm
Angle measuring range of Angle meter -3°— +145°
Precision Deviation of < ±0.02° in full spectrum range
FWHM <0.04°2θ
Instrument to light No need for light
X-Ray Tube  Cu, Co, Cr, Fe, Ni, Mo, Ag, W (optional)
X-Ray Tube Power 600W
Size 580 x 450x 680mm(L×W×H)
Weight <80KG
Power Supply 90-240V 50/60 Hz 0.6KVA
Cooling Method Built-in water circulation cooling system, no external water tank
Detector Proportional counting detector, SDD detector, one-dimensional array detector (optional)
Interface USB 
Minimum Step Width 0.0001°
Angle to Reproduce 0.0005° 
Monochromator Monochromator, minus Kβ fluorescence X-ray, improves P/B ratio
Linearity of Diffraction Angle < 0.02°(standard sample, full spectrum range)
Angular Positioning Speed 1500°/min
Maximum Linear Count Rate ≥5×105cps (proportional ratio)


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